Search Results for Metrology.

1.

Metrology

Author

Gao, Wei. editor. SpringerLink (Online service)

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https://doi.org/10.1007/978-981-10-4938-5

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2.

Mass Metrology

Author

Gupta, S. V. author. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-3-642-23412-5

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3.

Optical metrology

Author

Gåsvik, Kjell J. John Wiley & Sons.

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John Wiley http://dx.doi.org/10.1002/0470855606

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4.

Optical metrology

Author

Gåsvik, Kjell J.

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ONLINE(318819.1)

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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226
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John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html

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5.

Speckle metrology

Author

Erf, Robert K.

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ScienceDirect http://www.sciencedirect.com/science/book/9780122413605

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6.

Comprehensive mass metrology

Author

Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.

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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html
John Wiley http://dx.doi.org/10.1002/3527602992

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7.

Ultra-fast material metrology

Author

Horn, Alexander, PD Dr.

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John Wiley http://dx.doi.org/10.1002/9783527627929
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8.

Handbook of optical dimensional metrology

Author

Harding, Kevin G.

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9.

Semiconductor strain metrology principles and applications

Author

Wong, Terence K. S.

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10.

Instrumentation and metrology in oceanography

Author

Le Menn, Marc.

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John Wiley http://dx.doi.org/10.1002/9781118561959
Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html
ebrary http://site.ebrary.com/id/10684971

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11.

Optical imaging and metrology advanced technologies

Author

Osten, Wolfgang. Reingand, Nadya.

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12.

Information Modeling for Interoperable Dimensional Metrology

Author

Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-1-4471-2167-1

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13.

Springer Handbook of Metrology and Testing

Author

Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-3-642-16641-9

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14.

Software metrics and software metrology

Author

Abran, Alain, 1949-

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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791

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15.

Computational Surface and Roundness Metrology

Author

Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-1-84800-297-5

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16.

X-ray metrology in semiconductor manufacturing

Author

Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)

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17.

Handbook of silicon semiconductor metrology

Author

Diebold, A. C. (Alain C.)

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18.

Metrology for Fire Experiments in Outdoor Conditions

Author

Silvani, Xavier. author. SpringerLink (Online service)

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ONLINE(332373.1)

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http://dx.doi.org/10.1007/978-1-4614-7962-8

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19.

Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications

Author

Raza, Hassan. editor. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-3-642-22984-8

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20.

Distributed Large-Scale Dimensional Metrology New Insights

Author

Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.

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http://dx.doi.org/10.1007/978-0-85729-543-9

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21.

Digital holography for MEMS and microsystem metrology

Author

Asundi, Anand.

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ONLINE

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John Wiley http://dx.doi.org/10.1002/9781119997290
http://lib.myilibrary.com?id=317798
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22.

Advances in speckle metrology and related techniques

Author

Kaufmann, Guillermo H.

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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
http://site.ebrary.com/lib/alltitles/Doc?id=10446636

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23.

Handbook of optical metrology principles and applications

Author

Yoshizawa, T?ru, 1939-

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24.

Metrology in industry the key for quality

Author

Collège français de métrologie. Wiley InterScience (Online service)

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Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125

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25.

Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France

Author

International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)

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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706
John Wiley http://dx.doi.org/10.1002/9780470611371
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http://swb.eblib.com/patron/FullRecord.aspx?p=477706
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26.

Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems

Author

Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)

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https://doi.org/10.1007/978-3-030-18682-1

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27.

Metrology and standardization of nanotechnology : protocols and industrial innovations

Author

Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.

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Wiley Online Library

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28.

Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists

Author

Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.

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29.

Fringe pattern analysis for optical metrology : theory, algorithms, and applications

Author

Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.

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ONLINE(342225.1)

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Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
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30.

Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology

Author

Osten, Wolfgang. editor. SpringerLink (Online service)

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https://doi.org/10.1007/978-3-642-36359-7

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31.

Handbook of 3D machine vision optical metrology and imaging

Author

Song, Zhang.

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32.

Performance-based gear metrology kinematic-transmission-error computation and diagnosis

Author

Mark, William D.

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John Wiley http://dx.doi.org/10.1002/9781118357903
Books24x7 http://www.books24x7.com/marc.asp?bookid=51229

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33.

Laser metrology in fluid mechanics granulometry, temperature and concentration measurements

Author

Boutier, A. (Alain)

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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847
John Wiley http://dx.doi.org/10.1002/9781118576847

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34.

A practical guide to optical metrology for thin films

Author

Quinten, Michael.

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Check for Full Text Access restricted: MSVU users only
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John Wiley http://dx.doi.org/10.1002/9783527664344

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35.

Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics

Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics

Author

Proulx, Tom. editor. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-1-4614-0228-2

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36.

The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks

Author

Hebra, Alexius J. author. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-3-211-78381-8

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37.

Data Modeling for Metrology and Testing in Measurement Science

Author

Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-0-8176-4804-6

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38.

Fringe 2009 6th International Workshop on Advanced Optical Metrology

Author

Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-3-642-03051-2

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39.

Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal

Author

Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)

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http://dx.doi.org/10.1007/978-3-540-71273-2

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40.

Microwave Circuit Theory and Foundations of Microwave Metrology

Author

Engen, Glenn F.

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http://dx.doi.org/10.1049/PBEL009E

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41.

Handbook of surface and nanometrology

Author

Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.

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42.

Handbook of surface and nanometrology

Author

Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.

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43.

Clinical and Laboratory Medicine Textbook

Author

Ciaccio, Marcello. editor. SpringerLink (Online service)

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XX(522249.1)

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https://doi.org/10.1007/978-3-031-24958-7

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44.

Cover image for Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings

Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings

Author

Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)

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XX(519035.1)

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https://doi.org/10.1007/978-3-319-19390-8

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45.

Cover image for Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings

Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings

Author

Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)

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XX(519185.1)

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https://doi.org/10.1007/978-3-319-19941-2

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46.

Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications

Author

Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)

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XX(518392.1)

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https://doi.org/10.1007/978-1-4471-6741-9

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47.

Optical devices in ophthalmology and optometry technology, design principles and clinical applications

Author

Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.

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ONLINE(342196.1)

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John Wiley http://dx.doi.org/10.1002/9783527648962

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48.

Electrical impedance principles, measurement, and applications

Author

Callegaro, Luca.

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49.

Fundamentals of laser micromachining

Author

Schaeffer, Ronald D.

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50.

Compound semiconductor radiation detectors

Author

Owens, Alan.

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51.

Measurements with persons theory, methods, and implementation areas

Author

Berglund, Birgitta.

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Click here to view

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52.

100 years of superconductivity

Author

Rogalla, H. (Horst) Kes, P. H. (Peter H.)

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53.

Coordinate measuring machines and systems

Author

Hocken, Robert J. Pereira, Paulo H.

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54.

Computer network time synchronization the Network Time Protocol on Earth and in space

Author

Mills, David L.

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55.

Handbook of photonics for biomedical science

Author

Tuchin, V. V. (Valeri? Viktorovich)

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56.

Fundamental principles of engineering nanometrology

Author

Leach, R. K.

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ONLINE(355774.1)

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ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546

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57.

Fundamental principles of engineering nanometrology

Author

Leach, R. K.

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ScienceDirect http://www.sciencedirect.com/science/book/9780080964546

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58.

Computer network time synchronization the network time protocol

Author

Mills, David L.

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