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1. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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Online Library~1
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2. 
Cover image for Marked for Death Tabu
Marked for Death Tabu
Author 
Seagal, Steven. Little, Dwight H. Pacula, Joanna David,Keith Howard,Newton
Preferred Shelf Number 
PN1995.9.A3 M37 2006
Format: 
Availability 
Beytepe Library~1
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3. 
Cover image for ATL
ATL
Author 
Harris, Tip. London, Lauren. Big Boi (Musician) Williamson, Mykelti. David, Keith.
Preferred Shelf Number 
PN1995.9.C55 A85 2006
Format: 
Availability 
Beytepe Library~1
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