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1. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
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2. 
Cover image for Systematic Modeling and Analysis of Telecom Frontends and Their Building Blocks
Systematic Modeling and Analysis of Telecom Frontends and Their Building Blocks
Author 
Vanassche, Piet. author. Gielen, Georges. author. Sansen, Willy. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3174-2
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Online Library~1
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