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1. 
Cover image for Software Measurement Establish — Extract — Evaluate — Execute
Software Measurement Establish — Extract — Evaluate — Execute
Author 
Ebert, Christof. author. Dumke, Reiner. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71649-5
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Cover image for Software Development Measurement Programs Development, Management and Evolution
Software Development Measurement Programs Development, Management and Evolution
Author 
Staron, Miroslaw. author. Meding, Wilhelm. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-91836-5
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3. 
Cover image for Software Measurement 25th International Workshop on Software Measurement and 10th International Conference on Software Process and Product Measurement, IWSM-Mensura 2015, Kraków, Poland, October 5-7, 2015, Proceedings
Software Measurement 25th International Workshop on Software Measurement and 10th International Conference on Software Process and Product Measurement, IWSM-Mensura 2015, Kraków, Poland, October 5-7, 2015, Proceedings
Author 
Kobyliński, Andrzej. editor. Czarnacka-Chrobot, Beata. editor. Świerczek, Jaroslaw. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(518631.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-24285-9
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4. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Author 
Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-05415-0
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5. 
Cover image for Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Author 
Cuadrado-Gallego, Juan J. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Abran, Alain. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-85553-8
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6. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Author 
Dumke, Reiner R. editor. Braungarten, René. editor. Büren, Günter. editor. Abran, Alain. editor. Cuadrado-Gallego, Juan J. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-89403-2
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7. 
Cover image for Best Practices in Software Measurement How to use metrics to improve project and process performance
Best Practices in Software Measurement How to use metrics to improve project and process performance
Author 
Ebert, Christof. author. Bundschuh, Manfred. author. Dumke, Reiner. author. Schmietendorf, Andreas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138013
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8. 
Cover image for Smart Technologies, Systems and Applications 3rd International Conference, SmartTech-IC 2022, Cuenca, Ecuador, November 16-18, 2022, Revised Selected Papers
Smart Technologies, Systems and Applications 3rd International Conference, SmartTech-IC 2022, Cuenca, Ecuador, November 16-18, 2022, Revised Selected Papers
Author 
Narváez, Fabián R. editor. Urgilés, Fernando. editor. Bastos-Filho, Teodiano Freire. editor. Salgado-Guerrero, Juan Pablo. editor. (orcid) SpringerLink (Online service)
Preferred Shelf Number 
XX(520321.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-32213-6
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9. 
Cover image for Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part I
Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part I
Author 
Wyrzykowski, Roman. editor. Dongarra, Jack. editor. Deelman, Ewa. editor. Karczewski, Konrad. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520851.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-30442-2
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10. 
Cover image for Passive and Active Measurement 24th International Conference, PAM 2023, Virtual Event, March 21-23, 2023, Proceedings
Passive and Active Measurement 24th International Conference, PAM 2023, Virtual Event, March 21-23, 2023, Proceedings
Author 
Brunstrom, Anna. editor. Flores, Marcel. editor. Fiore, Marco. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520896.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-28486-1
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11. 
Cover image for Advanced Hybrid Information Processing 6th EAI International Conference, ADHIP 2022, Changsha, China, September 29-30, 2022, Proceedings, Part I
Advanced Hybrid Information Processing 6th EAI International Conference, ADHIP 2022, Changsha, China, September 29-30, 2022, Proceedings, Part I
Author 
Fu, Weina. editor. Yun, Lin. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520370.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-28787-9
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12. 
Cover image for Product Lifecycle Management. PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papers
Product Lifecycle Management. PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papers
Author 
Noël, Frédéric. editor. Nyffenegger, Felix. editor. (orcid) Rivest, Louis. editor. Bouras, Abdelaziz. editor. (orcid) SpringerLink (Online service)
Preferred Shelf Number 
XX(520558.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-25182-5
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