Search Results for Semiconductors -- Design and construction.

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Language: English

Author

Jaeger, Richard C.

(4)

Sicard, Etienne.

(4)

Blalock, Travis N.

(3)

Neamen, Donald A.

(3)

Wiley InterScience (Online service)

(3)

Ben Dhia, Sonia.

(2)

Bendhia, Sonia Delmas.

(2)

Iniewski, Krzysztof.

(2)

Wong, Ban P., 1953-

(2)

Baker, R. Jacob, 1964-

(1)

Baliga, B. Jayant, 1948-

(1)

Balsara, Poras T., 1961-

(1)

Binkley, David M.

(1)

Blalock, Travis N., ort. yaz.

(1)

(1)

Bowen, D. Keith (David Keith), 1940-

(1)

Brock, David C.

(1)

Brown, Marty, 1951-

(1)

Bruno, Giovanni.

(1)

Capezzuto, Pio.

(1)

Colino, Ronald P.

(1)

Cressler, John D.

(1)

Daly, James C., 1938-

(1)

Del Castillo, Enrique.

(1)

Doering, Robert, 1946-

(1)

Elsevier Science Publishers.

(1)

(1)

Galipeau, Denis P.

(1)

Hurwitz, Arnon Max.

(1)

Jackson, Kenneth A.

(1)

John Wiley & Sons.

(1)

Jones, Anthony C.

(1)

(1)

(1)

(1)

Leung, Gerry Chi Tak.

(1)

Levitin, Valim.

(1)

Luong, Howard Cam.

(1)

Lécuyer, Christophe.

(1)

Mack, Raymond A.

(1)

Madan, A. (Arun)

(1)

(1)

Nishi, Yoshio, 1940-

(1)

O'Brien, Paul (University lecturer)

(1)

Ohmi, Tadahiro, 1939-

(1)

(1)

Palestri, Pierpaolo.

(1)

(1)

Pimbley, J. M. (Joseph M.)

(1)

Ramaswami, Sesh.

(1)

Schröter, W. (Wolfgang)

(1)

Schwartz, G. C.

(1)

(1)

Sheng, William W.

(1)

Smith, Bruce W., 1959-

(1)

Sreedhar, Aswin.

(1)

Srikrishnan, K. V., 1948-

(1)

Staszewski, Robert Bogdan, 1965-

(1)

Suzuki, Kazuaki.

(1)

Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)

(1)

Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France)

(1)

Tanner, B. K. (Brian Keith)

(1)

Veendrick, H. J. M. (Harry J. M.)

(1)

(1)

Wong, Terence K. S.

(1)

(1)

Publication Date

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(4)

(3)

(3)

(3)

(3)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Metal oxide semiconductors, Complementary -- Design and construction.

(20)

Semiconductors -- Design and construction.

(15)

Integrated circuits -- Design and construction.

(10)

Electronic circuit design.

(6)

Digital integrated circuits -- Design and construction.

(4)

Nanoelectronics.

(3)

Power semiconductors -- Design and construction.

(3)

Compound semiconductors.

(2)

Electronic books.

(2)

Frequency synthesizers -- Design and construction.

(2)

Linear integrated circuits -- Design and construction.

(2)

Metal oksit yarıiletkenler, Tümleyici -- Tasarım ve yapım.

(2)

Schaltnetzteil.

(2)

Semiconductor switches -- Design and construction.

(2)

Silicon-on-insulator technology.

(2)

Switching circuits -- Design and construction.

(2)

Switching power supplies -- Design and construction.

(2)

Three-dimensional integrated circuits -- Design and construction.

(2)

Three-dimensional integrated circuits.

(2)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(2)

YARIİLETKENLER -- ÇİZİM VE YAPIM.

(2)

Amorphous semiconductors -- Design and construction.

(1)

Bipolar integrated circuits -- Design and construction.

(1)

Bipolar transistors -- Design and construction.

(1)

Chemical bonds.

(1)

Chemical vapor deposition.

(1)

Compound semiconductors -- Congresses.

(1)

Compound semiconductors -- Design and construction -- Materials.

(1)

Compound semiconductors -- Design and construction.

(1)

Compound semiconductors -- Industrial applications -- Congresses.

(1)

(1)

(1)

Density functionals -- Computer simulation.

(1)

(1)

Dijital entegre devreler -- Tasarım ve yapım.

(1)

ELEKTRONİK DEVRE TASARIMI.

(1)

Electron transport.

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic packaging.

(1)

Electronic structure.

(1)

Elektronik devre tasarımı.

(1)

(1)

(1)

(1)

Fairchild (Firm) -- Archives.

(1)

Fairchild (Firm) -- History.

(1)

(1)

Gate array circuits.

(1)

Image processing -- Digital techniques.

(1)

Integrated circuits -- Design and construction -- History.

(1)

Integrated circuits -- Masks.

(1)

Integrated circuits -- Measurement.

(1)

Integrated circuits -- Very large scale integration -- Design and construction.

(1)

Integrated circuits industry.

(1)

Integrated circuits.

(1)

Interconnects (Integrated circuit technology)

(1)

Manufacturing processes.

(1)

Materials science -- Computer simulation.

(1)

Mathematical models.

(1)

Metal oksit Yarı iletkenler, Tümleyici -- Tasarım ve yapım.

(1)

Metal oxide semiconductor field-effect transistors.

(1)

Metal oxide semiconductors -- Design and construction.

(1)

Microelectronic packaging.

(1)

Microlithography -- Industrial applications.

(1)

Multichip modules (Microelectronics)

(1)

Nanoelectronics -- Materials.

(1)

Nanostructure materials.

(1)

Plasma-enhanced chemical vapor deposition.

(1)

Production management.

(1)

Radio circuits -- Design and construction.

(1)

Semiconductor industry -- Handbooks, manuals, etc.

(1)

Semiconductor industry -- Production control.

(1)

Semiconductor wafers -- Inspection.

(1)

Semiconductor wafers.

(1)

Semiconductors -- Analysis.

(1)

Semiconductors -- Cleaning.

(1)

Semiconductors -- Congresses.

(1)

Semiconductors -- Defects -- Congresses.

(1)

Semiconductors -- Defects.

(1)

Semiconductors -- Design and construction -- Congresses.

(1)

Semiconductors -- Design and construction -- Handbooks, manuals, etc.

(1)

Semiconductors -- Design and construction -- History.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Semiconductors -- Design and construction -- Quality control.

(1)

Semiconductors -- Junctions.

(1)

Semiconductors -- Materials.

(1)

Semiconductors -- Mathematical models -- Congresses.

(1)

Semiconductors -- Simulation methods -- Congresses.

(1)

(1)

Silicon -- Congresses.

(1)

Silicon alloys.

(1)

Silicon crystals -- Growth.

(1)

Silicon crystals.

(1)

(1)

TECHNOLOGY & ENGINEERING / Electronics / Optoelectronics

(1)

(1)

Three-dimensional imaging.

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Wide gap semiconductors.

(1)

X-rays -- Diffraction.

(1)

Yarıiletkenler -- Çizim ve yapım.

(1)

İNTEGRE DEVRELER -- ÇİZİM VE YAPIM.

(1)

İntegre devreler.

(1)

Material Type

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Beytepe CD-ROM Koleksiyonu

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1.

Cover image for Microelectronic circuit design

Microelectronic circuit design

Microelectronic circuit design

Author

Jaeger, Richard C. Blalock, Travis N.

Preferred Shelf Number

TK7874 J33 2016

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2.

Cover image for Interatomic bonding in solids fundamentals, simulation, applications

Interatomic bonding in solids fundamentals, simulation, applications

Interatomic bonding in solids fundamentals, simulation, applications

Author

Levitin, Valim.

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ONLINE(342212.1)

Electronic Access

John Wiley http://dx.doi.org/10.1002/9783527671557

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3.

Cover image for Through-silicon vias for 3D integration

Through-silicon vias for 3D integration

Through-silicon vias for 3D integration

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Lau, John.

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Cover image for Semiconductor strain metrology principles and applications

Semiconductor strain metrology principles and applications

Semiconductor strain metrology principles and applications

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Wong, Terence K. S.

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ONLINE

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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610

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Nano-CMOS gate dielectric engineering

Nano-CMOS gate dielectric engineering

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Wong, Hei.

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6.

Cover image for Nanoscale CMOS VLSI circuits design for manufacturability

Nanoscale CMOS VLSI circuits design for manufacturability

Nanoscale CMOS VLSI circuits design for manufacturability

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Kundu, Sandip. Sreedhar, Aswin.

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7.

Cover image for Basics of CMOS cell design

Basics of CMOS cell design

Basics of CMOS cell design

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Sicard, Etienne. Ben Dhia, Sonia.

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8.

Cover image for Advanced circuits for emerging technologies

Advanced circuits for emerging technologies

Advanced circuits for emerging technologies

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Iniewski, Krzysztof.

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Connect to MyiLibrary resource
Wiley InterScience http://dx.doi.org/10.1002/9781118181508
Wiley http://dx.doi.org/10.1002/9781118181508

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9.

Cover image for Microelectronic circuit design

Microelectronic circuit design

Microelectronic circuit design

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Jaeger, Richard C. Blalock, Travis N.

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TK7874 J33 2011

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10.

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3D IC stacking technology

3D IC stacking technology

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Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

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Advanced CMOS cell design

Advanced CMOS cell design

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Sicard, Etienne. Ben Dhia, Sonia.

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12.

Cover image for Nanoscale MOS Transistors Semi-Classical Transport and Applications

Nanoscale MOS Transistors Semi-Classical Transport and Applications

Nanoscale MOS Transistors Semi-Classical Transport and Applications

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Esseni, David. Palestri, Pierpaolo. Selmi, Luca.

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