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Metal oxide semiconductors, Complementary -- Reliability.
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Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
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Strong, Alvin Wayne, 1946-
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ONLINE
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IEEE Xplore
http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
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Ker, Ming-Dou. Hsu, Sheng-Fu.
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http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
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