Search Results for Integrated circuits--Testing.

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Shelf Location: Electronic Library

Author

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Breuer, Melvin A.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Heyman, Joseph S.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

(1)

Machado, Gerson A. S., ed.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Francis C.

(1)

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Language

(11)

Publication Date

-

(3)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic books.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Integrated circuits -- Testing.

(3)

Digital integrated circuits -- Testing.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits -- Very large scale integration -- Testing.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

(2)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits -- Design and construction.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges.

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic circuits--Testing.

(1)

Electrostatics.

(1)

Expert systems (Computer science).

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Microelectronic packaging.

(1)

Multichip modules (Microelectronics)

(1)

Nondestructive testing -- Congresses.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Three-dimensional integrated circuits.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

Material Type

Library

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1.

Cover image for 3D IC stacking technology

3D IC stacking technology

3D IC stacking technology

Author

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Preferred Shelf Number

ONLINE

Electronic Access

Subscription required

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Online Library~1

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Copies:

2.

Cover image for ESD failure mechanisms and models

ESD failure mechanisms and models

ESD failure mechanisms and models

Author

Voldman, Steven H. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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3.

Cover image for System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

Author

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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4.

Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Author

Yichuang Sun, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS019E

Format:

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5.

Cover image for RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

Author

Scott, Allan W. Frobenius, Rex.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

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6.

Cover image for VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Author

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

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7.

Cover image for Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Author

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

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8.

Cover image for VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

Author

Hurst, Stanley L.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS009E

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9.

Cover image for Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Author

Machado, Gerson A. S., ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS008E

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10.

Cover image for Principles of semiconductor network testing

Principles of semiconductor network testing

Principles of semiconductor network testing

Author

Afshar, Amir.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

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11.

Cover image for Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Author

Taylor, Gaynor, ed. Russell, Gordon, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS004E

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12.

Cover image for Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Author

Wang, Francis C.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

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