Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Library
Switch to list view
Switch to thumbnail view
12 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author 
Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-5950-7
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author 
Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-32-9767-8
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-2493-2
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
Author 
Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.
Preferred Shelf Number 
ONLINE(335156.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-42024-5
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
Author 
Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-31494-0
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Biomedical Signal and Image Processing with Artificial Intelligence
Biomedical Signal and Image Processing with Artificial Intelligence
Author 
Paunwala, Chirag. editor. Paunwala, Mita. editor. Kher, Rahul. editor. Thakkar, Falgun. editor. Kher, Heena. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-15816-2
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Intelligent Computing and Applications Proceedings of the International Conference on ICA, 22-24 December 2014
Intelligent Computing and Applications Proceedings of the International Conference on ICA, 22-24 December 2014
Author 
Mandal, Durbadal. editor. Kar, Rajib. editor. Das, Swagatam. editor. Panigrahi, Bijaya Ketan. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-2268-2
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
Author 
Bhuvaneswari, M.C. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-1958-3
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Author 
Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Logic testing and design for testability
Logic testing and design for testability
Author 
Fujiwara, Hideo.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets