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Cover image for Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part II
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part II
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Leung, Victor C.M. editor. Li, Hezhang. editor. Hu, Xiping. editor. Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-65123-6
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Cover image for Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part I
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part I
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Leung, Victor C.M. editor. Li, Hezhang. editor. Hu, Xiping. editor. Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524 SpringerLink (Online service)
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Cover image for Computer Safety, Reliability, and Security 43rd International Conference, SAFECOMP 2024, Florence, Italy, September 18-20, 2024, Proceedings
Computer Safety, Reliability, and Security 43rd International Conference, SAFECOMP 2024, Florence, Italy, September 18-20, 2024, Proceedings
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Ceccarelli, Andrea. editor. (orcid)0000-0002-2291-2428 Trapp, Mario. editor. Bondavalli, Andrea. editor. (orcid)0000-0001-7366-6530 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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Cover image for Computer Safety, Reliability, and Security. SAFECOMP 2024 Workshops DECSoS, SASSUR, TOASTS, and WAISE, Florence, Italy, September 17, 2024, Proceedings
Computer Safety, Reliability, and Security. SAFECOMP 2024 Workshops DECSoS, SASSUR, TOASTS, and WAISE, Florence, Italy, September 17, 2024, Proceedings
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Ceccarelli, Andrea. editor. (orcid)0000-0002-2291-2428 Trapp, Mario. editor. Bondavalli, Andrea. editor. (orcid)0000-0001-7366-6530 Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Gallina, Barbara. editor. (orcid)0000-0002-6952-1053
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Cover image for Quality, Reliability, Security and Robustness in Heterogeneous Networks 12th International Conference, QShine 2016, Seoul, Korea, July 7-8, 2016, Proceedings
Quality, Reliability, Security and Robustness in Heterogeneous Networks 12th International Conference, QShine 2016, Seoul, Korea, July 7-8, 2016, Proceedings
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Lee, Jong-Hyouk. editor. Pack, Sangheon. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-60717-7
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Cover image for Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Second International Conference, RSSRail 2017, Pistoia, Italy, November 14-16, 2017, Proceedings
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Second International Conference, RSSRail 2017, Pistoia, Italy, November 14-16, 2017, Proceedings
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Fantechi, Alessandro. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-68499-4
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Cover image for Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
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Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-66266-4
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8. 
Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
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Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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9. 
Cover image for Computer Safety, Reliability, and Security SAFECOMP 2017 Workshops, ASSURE, DECSoS, SASSUR, TELERISE, and TIPS, Trento, Italy, September 12, 2017, Proceedings
Computer Safety, Reliability, and Security SAFECOMP 2017 Workshops, ASSURE, DECSoS, SASSUR, TELERISE, and TIPS, Trento, Italy, September 12, 2017, Proceedings
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Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-66284-8
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10. 
Cover image for Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification First International Conference, RSSRail 2016, Paris, France, June 28-30, 2016, Proceedings
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification First International Conference, RSSRail 2016, Paris, France, June 28-30, 2016, Proceedings
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Lecomte, Thierry. editor. Pinger, Ralf. editor. Romanovsky, Alexander. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-33951-1
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11. 
Cover image for Computer Safety, Reliability, and Security 35th International Conference, SAFECOMP 2016, Trondheim, Norway, September 21-23, 2016, Proceedings
Computer Safety, Reliability, and Security 35th International Conference, SAFECOMP 2016, Trondheim, Norway, September 21-23, 2016, Proceedings
Author 
Skavhaug, Amund. editor. Guiochet, Jérémie. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-45477-1
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12. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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