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Ker, Ming-Dou.
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COMPUTERS -- Logic Design.
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Integrated circuits -- Very large scale integration -- Computer simulation.
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Metal oxide semiconductors, Complementary -- Defects.
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Very high speed integrated circuits -- Defects -- Mathematical models.
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Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author
Ker, Ming-Dou. Hsu, Sheng-Fu.
Preferred Shelf Number
ONLINE
Electronic Access
IEEE Xplore
http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
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2.
High-speed VLSI interconnections
High-speed VLSI interconnections
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Goel, Ashok K., 1953-
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IEEE Xplore
http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516
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