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1. 
Cover image for Core-Shell Nanomaterials From Fundamentals to Applications
Core-Shell Nanomaterials From Fundamentals to Applications
Author 
Sharma, Shreya. Phogat, Peeyush. Thakur, Jahanvi. Singh, N. L.
Preferred Shelf Number 
XX(600416.1)
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527855766
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2. 
Cover image for Embedded Memory Design for Multi-Core and Systems on Chip
Embedded Memory Design for Multi-Core and Systems on Chip
Author 
Mohammad, Baker. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-8881-1
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3. 
Cover image for Introduction to Open Core Protocol Fastpath to System-on-Chip Design
Introduction to Open Core Protocol Fastpath to System-on-Chip Design
Author 
Schwaderer, W David. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0103-2
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4. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-34609-0
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5. 
Cover image for Fundamentals of VHDL for FPGA programming using Vivado
Fundamentals of VHDL for FPGA programming using Vivado
Author 
Pakdel, Majid, author.
Preferred Shelf Number 
TK7885.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126
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6. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume II
A Problem-Solving Approach to Electric Circuits Volume II
Author 
Asadi, Farzin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-95634-8
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7. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-7255-1
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8. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume III
A Problem-Solving Approach to Electric Circuits Volume III
Author 
Asadi, Farzin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-95493-1
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9. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume I
A Problem-Solving Approach to Electric Circuits Volume I
Author 
Asadi, Farzin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-95623-2
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10. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume IV
A Problem-Solving Approach to Electric Circuits Volume IV
Author 
Asadi, Farzin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-96586-9
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11. 
Cover image for Electrospinning : fundamentals, methods, and applications
Electrospinning : fundamentals, methods, and applications
Author 
Wang, Liming, editor. Qin, Xiaohong, editor.
Preferred Shelf Number 
TA418.9 .F5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841479
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12. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
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