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1. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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2. 
Cover image for High-Speed Photodiodes in Standard CMOS Technology
High-Speed Photodiodes in Standard CMOS Technology
Author 
Radovanović, Saša. author. Annema, Anne-Johan. author. Nauta, Bram. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-28592-X
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