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Cover image for Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
Author 
Gusev, Evgeni. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4367-8
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2. 
Cover image for Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Author 
Flandre, Denis. editor. Nazarov, Alexei N. editor. Hemment, Peter L.F. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3013-4
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3. 
Cover image for Foundations of Trusted Autonomy
Foundations of Trusted Autonomy
Author 
Abbass, Hussein A. editor. Scholz, Jason. editor. Reid, Darryn J. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-64816-3
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4. 
Cover image for Microflows and Nanoflows Fundamentals and Simulation
Microflows and Nanoflows Fundamentals and Simulation
Author 
Karniadakis, George. author. Beskok, Ali. author. Aluru, Narayan. author. Antman, S.S. editor. Marsden, J.E. editor.
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http://dx.doi.org/10.1007/0-387-28676-4
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