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1. 
Cover image for ESD protection methodologies : from component to system
ESD protection methodologies : from component to system
Author 
Bafleur, Marise, author. Caignet, Fabrice, author. Nolhier, Nicolas, author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9781785481222
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2. 
Cover image for Filamentary ion flow : theory and experiments
Filamentary ion flow : theory and experiments
Author 
Lattarulo, Francesco, author. Amoruso, Vitantonio, 1955- author.
Preferred Shelf Number 
ONLINE(341829.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1634274
ebrary http://site.ebrary.com/id/10839251
John Wiley http://dx.doi.org/10.1002/9781118821183
MyiLibrary http://www.myilibrary.com?id=578571
http://lib.myilibrary.com/detail.asp?id=578571
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3. 
Cover image for ESD basics from semiconductor manufacturing to use
ESD basics from semiconductor manufacturing to use
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Connect to MyiLibrary resource.
ebrary http://site.ebrary.com/id/10602092
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4. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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5. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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6. 
Cover image for 2008+ Solved Problems in Electromagnetics
2008+ Solved Problems in Electromagnetics
Author 
Nasar, Syed A.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/SBEW037E
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7. 
Cover image for ESD circuits and devices
ESD circuits and devices
Author 
Voldman, Steven H. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
Click for information
John Wiley http://dx.doi.org/10.1002/0470033479
http://www3.interscience.wiley.com/cgi-bin/bookhome/112572259
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8. 
Cover image for ESD RF technology and circuits
ESD RF technology and circuits
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Volltext http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521
http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521/ProductInformation.html
John Wiley http://dx.doi.org/10.1002/0470061405
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9. 
Cover image for Contamination and ESD control in high technology manufacturing
Contamination and ESD control in high technology manufacturing
Author 
Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423
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10. 
Cover image for ESD physics and devices
ESD physics and devices
Author 
Voldman, Steven H.
Preferred Shelf Number 
ONLINE
Electronic Access 
Click for information
John Wiley http://dx.doi.org/10.1002/0470013508
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/55138678.html
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11. 
Cover image for Advanced simulation methods for ESD protection development
Advanced simulation methods for ESD protection development
Author 
Esmark, Kai. Gossner, Harald. Stadler, Wolfgang.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080441474
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12. 
Cover image for Electrostatic discharge and electronic equipment a practical guide for designing to prevent ESD problems
Electrostatic discharge and electronic equipment a practical guide for designing to prevent ESD problems
Author 
Boxleitner, Warren.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263830
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