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1. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9377-9
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2. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-173-3
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3. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-8297-1
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4. 
Cover image for Test Pattern Generation using Boolean Proof Engines
Test Pattern Generation using Boolean Proof Engines
Author 
Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-2360-5
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5. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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6. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5315-0
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7. 
Cover image for Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approach
Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approach
Author 
Boiko, Igor. author. SpringerLink (Online service)
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ONLINE(330986.1)
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http://dx.doi.org/10.1007/978-1-4471-4465-6
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8. 
Cover image for Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Data
Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Data
Author 
Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.
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ONLINE(333195.1)
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http://dx.doi.org/10.1007/978-3-642-28667-4
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9. 
Cover image for China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technology
China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technology
Author 
Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)
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ONLINE(334420.1)
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http://dx.doi.org/10.1007/978-3-642-37398-5
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10. 
Cover image for System-Level Validation High-Level Modeling and Directed Test Generation Techniques
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
Author 
Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)
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ONLINE(331265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1359-2
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11. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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12. 
Cover image for Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
Author 
Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-977-2
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