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Subject: Error analysis (Mathematics)

Author

Wiley InterScience (Online service)

(5)

Biemer, Paul P.

(2)

Kartalopoulos, Stamatios V.

(2)

Ainsworth, Mark, 1965-

(1)

(1)

Alwin, Duane F. (Duane Francis), 1944-

(1)

(1)

Berendsen, Herman J. C.

(1)

Bevington, Philip R., 1933-

(1)

Buonaccorsi, John P., author.

(1)

(1)

Dow, John O., 1941-

(1)

Drosg, Manfred.

(1)

Fuller, Wayne A.

(1)

Gustafson, Paul, 1968, author.

(1)

(1)

Hlaváček, Ivan, 1933-

(1)

Hsu, David Y., 1945-

(1)

Hughes, Ifan, 1968-

(1)

IEEE Aerospace and Electronic Systems Society.

(1)

Jordache, Cornelius.

(1)

Narasimhan, Shankar.

(1)

Oden, J. Tinsley (John Tinsley), 1936-

(1)

Robinson, D. Keith, ort. yaz.

(1)

Stelzl, Ingeborg.

(1)

Taylor, John Robert, 1939-

(1)

Language

(17)

(1)

Publication Date

-

(5)

(3)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic books.

(4)

Finite element method.

(3)

Data transmission systems -- Quality control.

(2)

HATA ANALİZİ (MATEMATİK)

(2)

Optical communications -- Mathematics.

(2)

(2)

Ausreißerwert.

(1)

Automatic data collection systems.

(1)

Bayesian statistical decision theory.

(1)

Bias (Epidemiology)

(1)

Chemical process control -- Automation.

(1)

Data Collection -- methods.

(1)

(1)

EN KÜÇÜK KARELER.

(1)

Electrical engineering -- Mathematics.

(1)

Estimation theory.

(1)

FİZİKİ ÖLÇÜLER.

(1)

Hata Analizi (Matematik)

(1)

Hata analizi (Matematik)

(1)

(1)

MATEMATİKİ FİZİK.

(1)

Mathematical models.

(1)

Mathematical physics.

(1)

Messunsicherheit -- Fehlerrechnung.

(1)

Multivariate analysis.

(1)

Optik iletişim -- Matematik.

(1)

Physical measurements.

(1)

Prozessüberwachung.

(1)

Regression analysis.

(1)

Sampling (Statistics)

(1)

Sequential analysis.

(1)

Social sciences -- Statistical methods.

(1)

Sosyal Bilimler -- İstatistiksel Yöntemler.

(1)

(1)

Structural analysis (Engineering)

(1)

Uncertainty (Information theory)

(1)

Veri iletim sistemleri -- Kalite kontrolü.

(1)

ÇOKDEĞİŞKENLİ ANALİZ.

(1)

Material Type

Shelf Location

Beytepe CD-ROM Koleksiyonu

Beytepe General Collection

Electronic Library

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Beytepe Library

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1.

Cover image for Measurement error models

Measurement error models

Measurement error models

Author

Fuller, Wayne A. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407
John Wiley http://dx.doi.org/10.1002/9780470316665

Format:

Availability

Online Library~1

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Copies:

2.

Cover image for Latent class analysis of survey error

Latent class analysis of survey error

Latent class analysis of survey error

Author

Biemer, Paul P. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470891155

Format:

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Online Library~1

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3.

Cover image for Measurement error : models, methods, and applications

Measurement error : models, methods, and applications

Measurement error : models, methods, and applications

Author

Buonaccorsi, John P., author.

Preferred Shelf Number

QA275 .B965 2010

Electronic Access

Click here to view.

Format:

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Online Library~1

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4.

Cover image for Optical bit error rate : an estimation methodology

Optical bit error rate : an estimation methodology

Optical bit error rate : an estimation methodology

Author

Kartalopoulos, Stamatios V.

Preferred Shelf Number

TK5103.59 K363 2004

Format:

Availability

Beytepe Library~2

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5.

Cover image for Optical bit error rate an estimation methodology

Optical bit error rate an estimation methodology

Optical bit error rate an estimation methodology

Author

Kartalopoulos, Stamatios V.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060

Format:

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6.

Cover image for Data reconciliation & gross error detection an intelligent use of process data

Data reconciliation & gross error detection an intelligent use of process data

Data reconciliation & gross error detection an intelligent use of process data

Author

Narasimhan, Shankar. Jordache, Cornelius.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780884152552

Format:

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7.

Cover image for A unified approach to the finite element method and error analysis procedures

A unified approach to the finite element method and error analysis procedures

A unified approach to the finite element method and error analysis procedures

Author

Dow, John O., 1941-

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780122214400

Format:

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8.

Cover image for A student's guide to data and error analysis

A student's guide to data and error analysis

A student's guide to data and error analysis

Author

Berendsen, Herman J. C.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295

Format:

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Online Library~1

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9.

Cover image for Measurements and their uncertainties a practical guide to modern error analysis

Measurements and their uncertainties a practical guide to modern error analysis

Measurements and their uncertainties a practical guide to modern error analysis

Author

Hughes, Ifan, 1968- Hase, Thomas.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634

Format:

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10.

Cover image for Dealing with uncertainties a guide to error analysis

Dealing with uncertainties a guide to error analysis

Dealing with uncertainties a guide to error analysis

Author

Drosg, Manfred.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984

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11.

Cover image for Margins of error a study of reliability in survey measurement

Margins of error a study of reliability in survey measurement

Margins of error a study of reliability in survey measurement

Author

Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html
John Wiley http://dx.doi.org/10.1002/9780470146316

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12.

Cover image for Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students

Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students

Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students

Author

Akin, J. E.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750667227

Format:

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