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Subject: Failure time data analysis.

Author

Kalbfleisch, J. D.

(2)

Fleming, Thomas R.

(1)

Harrington, David P.

(1)

John Wiley & Sons.

(1)

Lawless, Jerald F., 1944-

(1)

(1)

Nelson, Wayne, 1936-

(1)

Prentice, Ross L.

(1)

Prentice, Ross L., ort. yaz.

(1)

Spizzichino, F. (Fabio), 1948-

(1)

Wang, John Wenyu.

(1)

Wiley InterScience (Online service)

(1)

Language

(7)

Publication Date

-

(2)

(2)

(1)

(1)

(1)

Subject

Survival analysis (Biometry)

(3)

Electronic books.

(2)

Regression analysis.

(2)

Accelerated life testing -- Statistical methods.

(1)

Başarısızlık süresi verilerinin analizi.

(1)

Martingales (Mathematics)

(1)

Medicine -- Research -- Statistical methods.

(1)

Models, Statistical.

(1)

Point processes.

(1)

(1)

Prognosis -- Statistical methods.

(1)

Regresyon analizi.

(1)

Reliability (Engineering) -- Statistical methods.

(1)

Survival Analysis.

(1)

Yaşam analizleri (Biyometri)

(1)

Material Type

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Beytepe General Collection

Electronic Library

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Beytepe Library

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1.

Cover image for Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Author

Lawless, Jerald F., 1944-

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781118033005
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Statistical methods for survival data analysis

Statistical methods for survival data analysis

Statistical methods for survival data analysis

Author

Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/0471458546
http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html

Format:

Availability

Online Library~1

Available:
Copies:

3.

Cover image for The statistical analysis of failure time data

The statistical analysis of failure time data

The statistical analysis of failure time data

Author

Kalbfleisch, J. D. Prentice, Ross L., ort. yaz.

Preferred Shelf Number

QA276 .K215 2002

Format:

Availability

Beytepe Library~1

Available:
Copies:

4.

Cover image for The statistical analysis of failure time data

The statistical analysis of failure time data

The statistical analysis of failure time data

Author

Kalbfleisch, J. D. Prentice, Ross L.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781118032985
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html
http://swb.eblib.com/patron/FullRecord.aspx?p=708259

Format:

Availability

Online Library~1

Available:
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5.

Cover image for Subjective probability models for lifetimes

Subjective probability models for lifetimes

Subjective probability models for lifetimes

Author

Spizzichino, F. (Fabio), 1948-

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Availability

Online Library~1

Available:
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6.

Cover image for Counting processes and survival analysis

Counting processes and survival analysis

Counting processes and survival analysis

Author

Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Spis treści http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html
ebrary http://site.ebrary.com/id/10509867
http://site.ebrary.com/lib/alltitles/Doc?id=10509867

Format:

Availability

Online Library~1

Available:
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7.

Cover image for Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Author

Nelson, Wayne, 1936-

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html

Format:

Availability

Online Library~1

Available:
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1

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