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2021
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Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
Format: 
Availability 
Online Library~1
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2. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
Format: 
Availability 
Online Library~1
Available:
Copies:
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