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1. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
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Availability 
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2. 
Cover image for Statistical quality control using Minitab, R, JMP, and Python
Statistical quality control using Minitab, R, JMP, and Python
Author 
Gupta, Bhisham C., 1942- author.
Preferred Shelf Number 
TS156 .Q3 G86 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718
Format: 
Availability 
Online Library~1
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