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1. 
Cover image for Ellipsometry at the Nanoscale
Ellipsometry at the Nanoscale
Author 
Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333782.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33956-1
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2. 
Cover image for Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Author 
Schubert, Mathias. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b11964
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Online Library~1
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