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Cover image for Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part III
Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part III
Author 
Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520246.1)
Electronic Access 
https://doi.org/10.1007/978-981-99-2449-3
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2. 
Cover image for Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedings
Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedings
Author 
Wang, Ning. editor. Rebolledo-Mendez, Genaro. editor. Dimitrova, Vania. editor. Matsuda, Noboru. editor. Santos, Olga C. editor.
Preferred Shelf Number 
XX(520682.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-36336-8
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3. 
Cover image for Computational Collective Intelligence 15th International Conference, ICCCI 2023, Budapest, Hungary, September 27-29, 2023, Proceedings
Computational Collective Intelligence 15th International Conference, ICCCI 2023, Budapest, Hungary, September 27-29, 2023, Proceedings
Author 
Nguyen, Ngoc Thanh. editor. Botzheim, János. editor. Gulyás, László. editor. Núñez, Manuel. editor. Treur, Jan. editor.
Preferred Shelf Number 
XX(521308.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-41456-5
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4. 
Cover image for In-depth understanding a computer model of integrated processing for narrative comprehension
In-depth understanding a computer model of integrated processing for narrative comprehension
Author 
Dyer, Michael George.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267253
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