Search Results for Digital integrated circuits -- Testing.

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Author

Abramovici, Miron.

(1)

Agrawal, Vishwani D., 1943-

(1)

Breuer, Melvin A.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chen, Wai-Kai, 1936-

(1)

Friedman, Arthur D.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Wang, Francis C.

(1)

Whitaker, Jerry C.

(1)

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(7)

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Digital integrated circuits -- Testing.

(4)

Computer engineering.

(2)

Digital integrated circuits -- Design and construction.

(2)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Electronic books.

(1)

Electronic digital computers.

(1)

Integrated circuits -- Very large scale integration -- Testing.

(1)

Integrated circuits -- Very large scale integration.

(1)

Microelectronics.

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Production engineering.

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Test circuit intégré

(1)

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

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Electronic Library

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1.

Cover image for Digital design and fabrication

Digital design and fabrication

Digital design and fabrication

Author

Oklobdzija, Vojin G.

Preferred Shelf Number

TK7885 .D54 2008

Electronic Access

Click here to view.

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2.

Cover image for Digital integrated circuits : design-for-test using Simulink and Stateflow

Digital integrated circuits : design-for-test using Simulink and Stateflow

Digital integrated circuits : design-for-test using Simulink and Stateflow

Author

Perelroyzen, Evgeni.

Preferred Shelf Number

TK7874 .P445 2007

Format:

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3.

Cover image for The VLSI handbook

The VLSI handbook

The VLSI handbook

Author

Chen, Wai-Kai, 1936-

Preferred Shelf Number

TK7874.75 .V573 2007

Electronic Access

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4.

Cover image for Microelectronics

Microelectronics

Microelectronics

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7874 .M4587 2006

Electronic Access

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5.

Cover image for The Computer Engineering Handbook.

The Computer Engineering Handbook.

The Computer Engineering Handbook.

Author

Oklobdzija, Vojin G., author. CRC Press LLC.

Preferred Shelf Number

TK7885 .C645 2002

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781420041545
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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6.

Cover image for Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Preferred Shelf Number

TK7874.75 B87 2000

Format:

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Beytepe Library~1

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7.

Cover image for Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Author

Wang, Francis C.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

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8.

Cover image for Digital systems testing and testable design

Digital systems testing and testable design

Digital systems testing and testable design

Author

Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057

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1

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