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1. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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2. 
Cover image for High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A
High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A
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Symposium A on High Tc Superconductor Materials (1990 : Strasbourg, France) Habermeier, H.-U. Kaldis, Emanuel. Schoenes, J. European Materials Research Society.
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3. 
Cover image for Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Author 
Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France) Waysand, G. Chardin, G. European Materials Research Society. Meeting (1988 : Strasbourg, France)
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4. 
Cover image for CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
Author 
Triboulet, R. Siffert, P. (Paul)
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5. 
Cover image for CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
Author 
Triboulet, R. Siffert, P. (Paul)
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6. 
Cover image for Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation (1995 : Strasbourg, France) Hemment, P. L. F. (Peter L. F.)
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7. 
Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Author 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
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8. 
Cover image for Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
Symposium A on Microstructuring and Microsystems (1995 : Strasbourg, France) Rooij, N. F. de. Symposium B on Materials for Sensors: Functional Nanoscaled Structures (1995 : Strasbourg, France) Symposium E on Structure and Properties of Metallic Thin Films and Multilayers (1995 : Strasbourg, France)
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9. 
Cover image for Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Author 
Symposium E on Nuclear Materials for Fission Reactors (1991 : Strasbourg, France) Matzke, Hj., 1936- Schumacher, G.
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10. 
Cover image for Modifications induced by irradiation in glasses proceedings of the Symposium F on Chemical and Physical Modifications Induced by Irradiation in Glasses, of the 1991 E-MRS Fall Conference, Strasbourg, France, November 5-7, 1991
Modifications induced by irradiation in glasses proceedings of the Symposium F on Chemical and Physical Modifications Induced by Irradiation in Glasses, of the 1991 E-MRS Fall Conference, Strasbourg, France, November 5-7, 1991
Author 
Symposium F on Chemical and Physical Modifications Induced by Irradiation in Glasses (1991 : Strasbourg, France) Mazzoldi, Paolo.
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11. 
Cover image for Silicon molecular beam epitaxy proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
Silicon molecular beam epitaxy proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
Author 
International Symposium on Silicon Molecular Beam Epitaxy (3rd : 1989 : Strasbourg, France) Kasper, Erich. Parker, E. H. C. European Materials Research Society.
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12. 
Cover image for Laser ablation proceedings of Symposium F: Third International Conference on Laser Ablation, COLA '95 of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Laser ablation proceedings of Symposium F: Third International Conference on Laser Ablation, COLA '95 of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
International Conference on Laser Ablation (3rd : 1996 : Strasbourg, France) Fogarassy, E. (Eric) Geohegan, David B. Stuke, M. (Michael)
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