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1. 
Cover image for Materials processing defects
Materials processing defects
Author 
Ghosh, S. K. (Swadhin Kumar) Predeleanu, M.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444817068
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2. 
Cover image for Advanced methods in materials processing defects
Advanced methods in materials processing defects
Author 
Predeleanu, M. Gilormini, P. International Conference on Materials Processing Defects (3rd : 1997 : Cachan, France)
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444826701
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3. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number 
TK7871 .D44 2009
Electronic Access 
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4. 
Cover image for Uncertainty quantification of stochastic defects in materials
Uncertainty quantification of stochastic defects in materials
Author 
Chu, Liu (Materials scientist), author.
Preferred Shelf Number 
TA404.23
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003226628
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for FAILURE ANALYSIS OF COMPOSITE MATERIALS WITH MANUFACTURING DEFECTS
FAILURE ANALYSIS OF COMPOSITE MATERIALS WITH MANUFACTURING DEFECTS
Author 
Talreja, R.
Preferred Shelf Number 
TA418.9 .C6
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003225737
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Cover image for Elements of structures and defects of crystalline materials
Elements of structures and defects of crystalline materials
Author 
Fang, Tsang-Tse, 1955- author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9780128142684
ScienceDirect http://www.sciencedirect.com/science/book/9780128142684
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7. 
Cover image for Defects in Advanced Electronic Materials and Novel Low Dimensional Structures
Defects in Advanced Electronic Materials and Novel Low Dimensional Structures
Author 
Chen, Weimin, editor. Stehr, Jan, editor. Buyanova, Irina, editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9780081020531
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8. 
Cover image for Voids in materials : from unavoidable defects to designed cellular materials
Voids in materials : from unavoidable defects to designed cellular materials
Author 
Gladysz, Gary M., author.
Preferred Shelf Number 
ONLINE(355524.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444563675
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9. 
Cover image for Defects and damage in composite materials and structures
Defects and damage in composite materials and structures
Author 
Heslehurst, Rikard Benton, author.
Preferred Shelf Number 
TA418.9 .C6 H48 2014
Electronic Access 
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10. 
Cover image for Advanced calculations for defects in materials : electronic structure methods
Advanced calculations for defects in materials : electronic structure methods
Author 
Alkauskas, Audrius.
Preferred Shelf Number 
TA410 A379 2011
Format: 
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11. 
Cover image for Defect passivation and doping engineering for highly efficient perovskite solar cells
Defect passivation and doping engineering for highly efficient perovskite solar cells
Author 
Li, Meicheng, editor.
Preferred Shelf Number 
TK2963 .P47
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781032614182
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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12. 
Cover image for High-Z Materials for X-ray Detection Material Properties and Characterization Techniques
High-Z Materials for X-ray Detection Material Properties and Characterization Techniques
Author 
Abbene, Leonardo. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-20955-0
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