Search Results for Metal oxide semiconductors -- Reliability.

5 Results Found

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Nanotechnology in electronics : materials, properties, devices

Author

P. M., Visakh, editor. Semkin, Artem, editor. B., Raneesh, 1986- editor. Lazović, Saša, editor.

Preferred Shelf Number

TK7874.84

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229

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Metal oxide nanocomposite thin films for optoelectronic device applications

Author

Zargar, Rayees Ahmad, editor.

Preferred Shelf Number

TA418.9 .T45 M48 2023

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636

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Semiconductor process reliability in practice

Author

Gan, Zhenghao. Wong, Waisum. Liou, Juin J.

Preferred Shelf Number

ONLINE

Electronic Access

Subscription required

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Reliability wearout mechanisms in advanced CMOS technologies

Author

Strong, Alvin Wayne, 1946-

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029

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Transient-induced latchup in CMOS integrated circuits

Author

Ker, Ming-Dou. Hsu, Sheng-Fu.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758

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