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1. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J.
Preferred Shelf Number 
ONLINE(318819.1)
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534
MyiLibrary http://www.myilibrary.com?id=26972
John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
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2. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
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John Wiley http://dx.doi.org/10.1002/0470855606
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3. 
Cover image for INTRODUCTION TO OPTICAL METROLOGY
INTRODUCTION TO OPTICAL METROLOGY
Author 
Sirohi, R. S.
Preferred Shelf Number 
QC367
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003531845
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
Author 
Harding, Kevin G.
Preferred Shelf Number 
T50 .H268 2013
Electronic Access 
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5. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
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ONLINE
Electronic Access 
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http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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6. 
Cover image for Handbook of optical metrology : principles and applications
Handbook of optical metrology : principles and applications
Author 
Yoshizawa, Toru, 1939-
Preferred Shelf Number 
QC367 .H36 2009
Electronic Access 
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7. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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8. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Author 
Osten, Wolfgang. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-642-36359-7
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9. 
Cover image for Handbook of 3D machine vision : optical metrology and imaging
Handbook of 3D machine vision : optical metrology and imaging
Author 
Song, Zhang.
Preferred Shelf Number 
TK8315 .H36 2013
Electronic Access 
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10. 
Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
Author 
Quinten, Michael.
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ONLINE
Electronic Access 
Check for Full Text Access restricted: MSVU users only
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John Wiley http://dx.doi.org/10.1002/9783527664344
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11. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Author 
Proulx, Tom. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0228-2
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12. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03051-2
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