Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Author 
Bai, Xiao. editor. Hancock, Edwin R. editor. Ho, Tin Kam. editor. Wilson, Richard C. editor. Biggio, Battista. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-97785-0
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Data Complexity in Pattern Recognition
Data Complexity in Pattern Recognition
Author 
Basu, Mitra. editor. Ho, Tin Kam. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-172-3
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets