Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Switch to list view
Switch to thumbnail view
8 Results Found Subscribe to search results
00000000DEFAULT
Print
1. 
Cover image for Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
Author 
Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-5049-2
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Which-Is-Better (WIB): Problems in Reliability Theory
Which-Is-Better (WIB): Problems in Reliability Theory
Author 
Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-27316-2
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Applications in Reliability and Statistical Computing
Applications in Reliability and Statistical Computing
Author 
Pham, Hoang. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-21232-1
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for International Conference on Reliable Systems Engineering (ICoRSE) - 2022
International Conference on Reliable Systems Engineering (ICoRSE) - 2022
Author 
Cioboată, Daniela Doina. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-15944-2
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Author 
Varde, Prabhakar V. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-19-9334-3
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-26708-6
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
Author 
Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-20813-8
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Author 
Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-19872-9
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets