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1. 
Cover image for Ion beam handbook for material analysis
Ion beam handbook for material analysis
Author 
Mayer, James W., 1930- Rimini, E.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780124808607
Format: 
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2. 
Cover image for Ion implantation in semiconductors, silicon and germanium
Ion implantation in semiconductors, silicon and germanium
Author 
Mayer, James W., 1930- Eriksson, Lennart, 1938- author. Davies, John Arthur, 1927- author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780124808508
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3. 
Cover image for Laser annealing of semiconductors
Laser annealing of semiconductors
Author 
Poate, J. M. Mayer, James W., 1930-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125588201
Format: 
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4. 
Cover image for Patterns of Light Chasing the Spectrum from Aristotle to LEDs
Patterns of Light Chasing the Spectrum from Aristotle to LEDs
Author 
Beeson, Steven. author. Mayer, James W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75107-8
Format: 
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5. 
Cover image for Ion Implantation and Synthesis of Materials
Ion Implantation and Synthesis of Materials
Author 
Nastasi, Michael. author. Mayer, James W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-45298-0
Format: 
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6. 
Cover image for Ion beam analysis : fundamentals and applications
Ion beam analysis : fundamentals and applications
Author 
Nastasi, Michael Anthony, 1950- author. Mayer, James W., 1930- author. Wang, Yongqiang (Nuclear physicist), author.
Preferred Shelf Number 
ONLINE(356970.1)
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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7. 
Cover image for Silver Metallization Stability and Reliability
Silver Metallization Stability and Reliability
Author 
Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84800-027-8
Format: 
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8. 
Cover image for Fundamentals of Nanoscale Film Analysis
Fundamentals of Nanoscale Film Analysis
Author 
Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-29261-8
Format: 
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9. 
Cover image for Materials analysis by ion channeling submicron crystallography
Materials analysis by ion channeling submicron crystallography
Author 
Feldman, Leonard C. Mayer, James W., 1930- Picraux, S. T., 1943-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122526800
Format: 
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10. 
Cover image for Backscattering spectrometry
Backscattering spectrometry
Author 
Chu, Wei-Kan. Mayer, James W., 1930- joint author. Nicolet, Marc-A., joint author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780121738501
Format: 
Availability 
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