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Cover image for Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part II
Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part II
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Wyrzykowski, Roman. editor. Dongarra, Jack. editor. Deelman, Ewa. editor. Karczewski, Konrad. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-30445-3
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Cover image for Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedings
Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedings
Author 
Wang, Ning. editor. Rebolledo-Mendez, Genaro. editor. Dimitrova, Vania. editor. Matsuda, Noboru. editor. Santos, Olga C. editor.
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https://doi.org/10.1007/978-3-031-36336-8
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Cover image for Novel & Intelligent Digital Systems: Proceedings of the 3rd International Conference (NiDS 2023) Volume 2
Novel & Intelligent Digital Systems: Proceedings of the 3rd International Conference (NiDS 2023) Volume 2
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Kabassi, Katerina. editor. Mylonas, Phivos. editor. Caro, Jaime. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-44146-2
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Cover image for Novel & Intelligent Digital Systems: Proceedings of the 3rd International Conference (NiDS 2023) Volume 1
Novel & Intelligent Digital Systems: Proceedings of the 3rd International Conference (NiDS 2023) Volume 1
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Kabassi, Katerina. editor. Mylonas, Phivos. editor. Caro, Jaime. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-44097-7
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Cover image for Adaptive tests of significance using permutations of residuals with R and SAS
Adaptive tests of significance using permutations of residuals with R and SAS
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O'Gorman, Thomas W.
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John Wiley http://dx.doi.org/10.1002/9781118218259
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Cover image for McGraw-Hill's ACT
McGraw-Hill's ACT
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Dulan, Steven W. Advantage Education (Firm)
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Cover image for McGraw-Hill's MCAT
McGraw-Hill's MCAT
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Hademenos, George J. McCloskey, Candice J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A.
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Cover image for McGraw-Hill's ACT
McGraw-Hill's ACT
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Dulan, Steven W. Advantage Education (Firm)
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Cover image for McGraw-Hill's 6 GRE practice tests
McGraw-Hill's 6 GRE practice tests
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Zahler, Kathy A. Thomas, Christopher, 1973-
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10. 
Cover image for Computerized adaptive testing theory and practice
Computerized adaptive testing theory and practice
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Linden, Wim J. van der. Glas, Cees A. W.
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