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Publication Date: 2010

Author

Baker, R. Jacob, 1964-

(1)

(1)

(1)

Gao, Jianjun, 1968-

(1)

Iniewski, Krzysztof.

(1)

(1)

Pulfrey, David L.

(1)

Sattler, Klaus D.

(1)

(1)

Wiley InterScience (Online service)

(1)

Language

(8)

Subject

Bipolar transistors.

(1)

Compound semiconductors -- Mathematical models.

(1)

Compound semiconductors -- Testing.

(1)

(1)

Electronic apparatus and appliances.

(1)

Electronic devices -- Materials.

(1)

Electronic polymers.

(1)

Field-effect transistors -- Mathematical models.

(1)

Field-effect transistors -- Testing.

(1)

Field-effect transistors.

(1)

Integrated circuits -- Design and construction.

(1)

(1)

(1)

Metal oxide semiconductor field-effect transistors.

(1)

Metal oxide semiconductors, Complementary -- Design and construction.

(1)

Microwave measurements.

(1)

Microwave transistors.

(1)

Nanoelectronics -- Handbooks, manuals, etc.

(1)

Nanophotonics -- Handbooks, manuals, etc.

(1)

Organic electronics.

(1)

Photon emission.

(1)

Radio measurements.

(1)

Semiconductors -- Effect of radiation on.

(1)

Semiconductors.

(1)

(1)

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1.

Cover image for Understanding modern transistors and diodes

Understanding modern transistors and diodes

Understanding modern transistors and diodes

Author

Pulfrey, David L.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=324078

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Online Library~1

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2.

Cover image for RF and microwave modeling and measurement techniques for field effect transistors

RF and microwave modeling and measurement techniques for field effect transistors

RF and microwave modeling and measurement techniques for field effect transistors

Author

Gao, Jianjun, 1968- Knovel (Firm)

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541

Format:

Availability

Online Library~1

Available:
Copies:

3.

Cover image for RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Author

Gao, Jianjun

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/SBEW027E

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Online Library~1

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4.

Cover image for CMOS circuit design, layout, and simulation

CMOS circuit design, layout, and simulation

CMOS circuit design, layout, and simulation

Author

Baker, R. Jacob, 1964- Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Wiley InterScience An electronic book accessible through the World Wide Web; click for information

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Online Library~1

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5.

Cover image for Radiation effects in semiconductors

Radiation effects in semiconductors

Radiation effects in semiconductors

Author

Iniewski, Krzysztof.

Preferred Shelf Number

TK7871.85 .R317 2010

Electronic Access

Click here to view.

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6.

Cover image for Organic electronics : materials, processing, devices and applications

Organic electronics : materials, processing, devices and applications

Organic electronics : materials, processing, devices and applications

Author

So, Franky.

Preferred Shelf Number

TK7871.15 .P6 O74 2010

Electronic Access

Click here to view.

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7.

Cover image for Handbook of nanophysics. Nanoelectronics and nanophotonics

Handbook of nanophysics. Nanoelectronics and nanophotonics

Handbook of nanophysics. Nanoelectronics and nanophotonics

Author

Sattler, Klaus D.

Preferred Shelf Number

TK7874.84 .H36 2010

Electronic Access

Click here to view.

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8.

Cover image for Designing Dynamic Circuit Response (Analog Circuit Design Series Volume 2)

Designing Dynamic Circuit Response (Analog Circuit Design Series Volume 2)

Designing Dynamic Circuit Response (Analog Circuit Design Series Volume 2)

Author

Feucht, D.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/SBCS014E

Format:

Availability

Online Library~1

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1

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