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1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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2. 
Cover image for Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
Author 
Ali, Syed Riffat. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-01647-0
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3. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
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Online Library~1
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