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1. 
Cover image for Information Security Practice and Experience 19th International Conference, ISPEC 2024, Wuhan, China, October 25-27, 2024, Proceedings
Information Security Practice and Experience 19th International Conference, ISPEC 2024, Wuhan, China, October 25-27, 2024, Proceedings
Author 
Xia, Zhe. editor. (orcid)0000-0003-4397-1248 Chen, Jiageng. editor. (orcid)0000-0001-9033-2575 SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-9053-1
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2. 
Cover image for Self-restructuring in Fault Tolerant Architecture Processor Arrays with Spares
Self-restructuring in Fault Tolerant Architecture Processor Arrays with Spares
Author 
Takanami, Itsuo. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-96-1539-1
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3. 
Cover image for Intelligent Computing, Smart Communication and Network Technologies First International Conference, ICICSCNT 2023, Chennai, India, May 17-18, 2023, Proceedings
Intelligent Computing, Smart Communication and Network Technologies First International Conference, ICICSCNT 2023, Chennai, India, May 17-18, 2023, Proceedings
Author 
Dassan, Paulraj. editor. (orcid)0000-0002-8853-9945 Thirumaaran, Sethukarasi. editor. (orcid)0000-0002-9433-2609 Subramani, Neelakandan. editor. (orcid)0000-0003-2337-8471 SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-75957-4
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4. 
Cover image for Applications in Reliability and Statistical Computing
Applications in Reliability and Statistical Computing
Author 
Pham, Hoang. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-21232-1
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5. 
Cover image for Machine learning for iOS developers
Machine learning for iOS developers
Author 
Mishra, Abhishek, author.
Preferred Shelf Number 
Q325.5 .M57 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119602927
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6. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-46097-0
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