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1. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J.
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John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
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2. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0470855606
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3. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
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Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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4. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
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Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
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John Wiley http://dx.doi.org/10.1002/9783527681075
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5. 
Cover image for Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
Author 
Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-04098-6
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