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Quality control.
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1. 
Cover image for Fracture mechanics. 1, Analysis of reliability and quality control
Fracture mechanics. 1, Analysis of reliability and quality control
Author 
Grous, Ammar, author.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118580004
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118580004
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2. 
Cover image for Barrier engineering : models and methods for technical safety
Barrier engineering : models and methods for technical safety
Author 
Liu, Yiliu, author.
Preferred Shelf Number 
TA169.7
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003245636
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Cover image for What every engineer should know about reliability and risk analysis
What every engineer should know about reliability and risk analysis
Author 
Modarres, M. (Mohammad), author. Groth, Katrina, author.
Preferred Shelf Number 
TA169 .M63 2023
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003307495
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Cover image for Applied reliability, usability, and quality for engineers
Applied reliability, usability, and quality for engineers
Author 
Dhillon, B. S. (Balbir S.), 1947- author.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003298571
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for Design of mechanical systems based on statistics : a guide to improving product reliability
Design of mechanical systems based on statistics : a guide to improving product reliability
Author 
Woo, Seong-woo, author.
Preferred Shelf Number 
TJ245.5
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429022050
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Cover image for Reliability management and engineering : challenges and future trends
Reliability management and engineering : challenges and future trends
Author 
Garg, Harish, editor. Ram, Mangey, editor.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429268922
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Guidelines for failure modes and effects analysis for medical devices
Guidelines for failure modes and effects analysis for medical devices
Author 
PRESS, DYADEM.
Preferred Shelf Number 
R856.6
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429205804
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Cover image for Quality Assurance in Research and Development
Quality Assurance in Research and Development
Author 
Roberts, author.
Preferred Shelf Number 
T175.5 R634 2014
Electronic Access 
Click here to view.
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9. 
Cover image for Guidelines for Laboratory Quality Auditing
Guidelines for Laboratory Quality Auditing
Author 
Singer, author.
Preferred Shelf Number 
R850 .S564 2014
Electronic Access 
Click here to view.
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10. 
Cover image for Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
Author 
Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.
Preferred Shelf Number 
ONLINE(365001.1)
Electronic Access 
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863
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11. 
Cover image for Applied reliability
Applied reliability
Author 
Tobias, Paul A. Trindade, David C.
Preferred Shelf Number 
TA169 T63 2012
Format: 
Availability 
Beytepe Library~1
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12. 
Cover image for Design for reliability
Design for reliability
Author 
Raheja, Dev. Gullo, Louis J.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791
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