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1. 
Cover image for Surfaces and interfaces of electronic materials
Surfaces and interfaces of electronic materials
Author 
Brillson, L. J.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=951893
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6542360
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6542360
John Wiley http://dx.doi.org/10.1002/9783527665709
MyiLibrary, Table of contents http://www.myilibrary.com?id=371977&ref=toc
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2. 
Cover image for Optical techniques for solid-state materials characterization
Optical techniques for solid-state materials characterization
Author 
Prasankumar, Rohit P. Taylor, Antoinette J., 1956-
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Modern Luminescence Spectroscopy of Minerals and Materials
Modern Luminescence Spectroscopy of Minerals and Materials
Author 
Gaft, Michael. author. Reisfeld, Renata. author. Panczer, Gérard. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137490
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4. 
Cover image for Kramers-Kronig Relations in Optical Materials Research
Kramers-Kronig Relations in Optical Materials Research
Author 
Lucarini, Valerio. author. Peiponen, Kai-Erik. author. Saarinen, Jarkko J. author. Vartiainen, Erik M. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138913
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5. 
Cover image for Nanoscale spectroscopy with applications
Nanoscale spectroscopy with applications
Author 
Musa, Sarhan M., editor.
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ONLINE(342754.1)
Electronic Access 
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6. 
Cover image for Applications of vibrational spectroscopy in food science
Applications of vibrational spectroscopy in food science
Author 
Li-Chan, Eunice. Griffiths, Peter R., 1942- Chalmers, John M.
Preferred Shelf Number 
TX541 A78 2010 V.1
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Beytepe Library~2
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7. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-38347-5
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8. 
Cover image for Spectroscopic ellipsometry principles and applications
Spectroscopic ellipsometry principles and applications
Author 
Fujiwara, Hiroyuki. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470060193
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9. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138175
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10. 
Cover image for CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
Author 
Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b139047
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11. 
Cover image for The Physics of Thin Film Optical Spectra An Introduction
The Physics of Thin Film Optical Spectra An Introduction
Author 
Stenzel, Olaf. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-27905-9
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