Search Results for Integrated circuits--Testing.

30 Results Found

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Testing for small-delay defects in nanoscale CMOS integrated circuits

Author

Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.

Preferred Shelf Number

TK7871.99 .M44 T43 2014

Electronic Access

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GaN power devices for efficient power conversion

Author

Lidow, Alex, author.

Preferred Shelf Number

TK7871.95 .L53 2025

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980

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Flexible electronic packaging and encapsulation technology

Author

Meng, Hong, editor. Huang, Wei, editor.

Preferred Shelf Number

TK7870.15 .F54 2024

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729

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Practical ESD protection design

Author

Wang, Albert Z. H., 1962- author.

Preferred Shelf Number

TK7874

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434

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Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Author

Domingo, George, 1937- author.

Preferred Shelf Number

TK7871.85 .D66 2020

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124

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Handbook of 3D integration. Volume 4, Design, test, and thermal management

Author

Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.

Preferred Shelf Number

TK7874.893 .H36 2019

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052

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Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar

Author

Dorf, Richard C., author Dorf, Richard C., editor.

Preferred Shelf Number

TK145

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781315222158
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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Nanoelectronics : materials, devices, applications

Author

Puers, R., editor.

Preferred Shelf Number

TK7874.84

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728

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Design of 3D integrated circuits and systems

Author

Sharma, Rohit, editor.

Preferred Shelf Number

TK7874.893 .D48 2014

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10.

3D IC stacking technology

Author

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Preferred Shelf Number

ONLINE

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11.

ESD failure mechanisms and models

Author

Voldman, Steven H. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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12.

System-on-chip test architectures nanometer design for testability

Author

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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