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1. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
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2. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)
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ONLINE(333265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29761-8
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3. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-73886-2
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4. 
Cover image for Electron microscopy and structure of materials : proceedings
Electron microscopy and structure of materials : proceedings
Author 
International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)
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TA 407 I65 1972
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5. 
Cover image for Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Author 
Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7167-8
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6. 
Cover image for Transmission Electron Microscopy A Textbook for Materials Science
Transmission Electron Microscopy A Textbook for Materials Science
Author 
Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-76501-3
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7. 
Cover image for EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
Author 
Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-85226-1
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8. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-3019-3
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9. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/3-540-31915-8
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10. 
Cover image for Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
Author 
Browning, Nigel D.. Pennycook, Stephen J..
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ONLINE
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Access by subscription
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11. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
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ONLINE
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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12. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
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ONLINE
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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