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1. 
Cover image for Metrology
Metrology
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Gao, Wei. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-4938-5
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Cover image for Mass Metrology
Mass Metrology
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Gupta, S. V. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-23412-5
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Cover image for Optical metrology
Optical metrology
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Gåsvik, Kjell J. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0470855606
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Cover image for Optical metrology
Optical metrology
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Gåsvik, Kjell J.
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ONLINE(318819.1)
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226
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John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
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5. 
Cover image for Speckle metrology
Speckle metrology
Author 
Erf, Robert K.
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ScienceDirect http://www.sciencedirect.com/science/book/9780122413605
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6. 
Cover image for Comprehensive mass metrology
Comprehensive mass metrology
Author 
Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html
John Wiley http://dx.doi.org/10.1002/3527602992
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7. 
Cover image for Metrology for engineers
Metrology for engineers
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Galyer, J. F. W. Shotbolt, C. R., ort. yaz.
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T 50 G3 1980
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Cover image for Ultra-fast material metrology
Ultra-fast material metrology
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Horn, Alexander, PD Dr.
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John Wiley http://dx.doi.org/10.1002/9783527627929
http://site.ebrary.com/lib/alltitles/Doc?id=10332978
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9. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
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Harding, Kevin G.
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10. 
Cover image for Instrumentation and metrology in oceanography
Instrumentation and metrology in oceanography
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Le Menn, Marc.
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ebrary An electronic book accessible through the World Wide Web; click to view
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John Wiley http://dx.doi.org/10.1002/9781118561959
Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html
ebrary http://site.ebrary.com/id/10684971
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11. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
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Osten, Wolfgang. Reingand, Nadya.
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ONLINE
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http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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12. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
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Wong, Terence K. S.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
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