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1. 
Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
Format: 
Availability 
Online Library~1
Available:
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2. 
Cover image for Tangled memories : the Vietnam War, the AIDS epidemic, and the politics of remembering
Tangled memories : the Vietnam War, the AIDS epidemic, and the politics of remembering
Author 
Sturken, Marita, 1957-
Preferred Shelf Number 
E169.12 S849 1997
Format: 
Availability 
Beytepe Library~1
Available:
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