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1. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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2. 
Cover image for The Test and Launch Control Technology for Launch Vehicles
The Test and Launch Control Technology for Launch Vehicles
Author 
Song, Zhengyu. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-8712-7
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3. 
Cover image for Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
Author 
Ohnhäuser, Frank. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-662-47020-6
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4. 
Cover image for Digital design and fabrication
Digital design and fabrication
Author 
Oklobdzija, Vojin G.
Preferred Shelf Number 
TK7885 .D54 2008
Electronic Access 
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5. 
Cover image for Computers, Software Engineering, and Digital Devices
Computers, Software Engineering, and Digital Devices
Author 
Dorf, Richard C., author. Taylor and Francis.
Preferred Shelf Number 
TK7885
Electronic Access 
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