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1. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-2493-2
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2. 
Cover image for Transmission lines in digital and analog electronic systems signal integrity and crosstalk
Transmission lines in digital and analog electronic systems signal integrity and crosstalk
Author 
Paul, Clayton R.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732774
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Online Library~1
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