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1. 
Cover image for Defects in organic semiconductors and devices
Defects in organic semiconductors and devices
Author 
Nguyen, Thien-Phap, author.
Preferred Shelf Number 
TK7871.99 .O74 N48 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451
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2. 
Cover image for Comparators in Nanometer CMOS Technology
Comparators in Nanometer CMOS Technology
Author 
Goll, Bernhard. author. Zimmermann, Horst. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-662-44482-5
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3. 
Cover image for Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Author 
Jin, Helena. editor. Sciammarella, Cesar. editor. Yoshida, Sanichiro. editor. Lamberti, Luciano. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06986-9
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4. 
Cover image for Coronal Mass Ejections An Introduction
Coronal Mass Ejections An Introduction
Author 
Howard, Timothy. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8789-1
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5. 
Cover image for Fundamentals of Solid State Engineering
Fundamentals of Solid State Engineering
Author 
Razeghi, Manijeh. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-92168-6
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6. 
Cover image for Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Author 
Seebauer, Edmund G. author. Kratzer, Meredith C. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84882-059-3
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7. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
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8. 
Cover image for Particle Detection with Drift Chambers
Particle Detection with Drift Chambers
Author 
Rolandi, Luigi. author. Riegler, Werner. author. Blum, Walter. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-76684-1
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9. 
Cover image for History of Semiconductor Engineering
History of Semiconductor Engineering
Author 
Lojek, Bo. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-34258-8
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10. 
Cover image for Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
Author 
Lang, Sidney B. author. Chan, Helen L. W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-38039-1
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11. 
Cover image for Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies
Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies
Author 
Henzler, Stephan. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-5081-X
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12. 
Cover image for Radiation Effects on Embedded Systems
Radiation Effects on Embedded Systems
Author 
VELAZCO, RAOUL. editor. FOUILLAT, PASCAL. editor. REIS, RICARDO. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5646-8
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