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421. 
Cover image for Fundamentals of Semiconductors Physics and Materials Properties
Fundamentals of Semiconductors Physics and Materials Properties
Author 
Yu, Peter Y. Cardona, Manuel. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137661
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422. 
Cover image for Modeling and Simulation for RF System Design
Modeling and Simulation for RF System Design
Author 
Frevert, Ronny. author. Haase, Joachim. author. Jancke, Roland. author. Knöchel, Uwe. author. Schwarz, Peter. author.
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http://dx.doi.org/10.1007/0-387-27585-1
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423. 
Cover image for Field Emission in Vacuum Microelectronics
Field Emission in Vacuum Microelectronics
Author 
Fursey, George. author. Brodie, Ivor. editor. Schwoebel, Paul. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139052
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424. 
Cover image for Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
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Flandre, Denis. editor. Nazarov, Alexei N. editor. Hemment, Peter L.F. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3013-4
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425. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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426. 
Cover image for Materials Fundamentals of Gate Dielectrics
Materials Fundamentals of Gate Dielectrics
Author 
Demkov, Alexander A. editor. Navrotsky, Alexandra. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3078-9
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427. 
Cover image for Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisations
Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisations
Author 
Kasper, Erich. author. Paul, D.J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137494
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428. 
Cover image for Magnetism Materials and Applications
Magnetism Materials and Applications
Author 
Trémolet de Lacheisserie, Étienne. editor. Gignoux, Damien. editor. Schlenker, Michel. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-23063-4
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429. 
Cover image for Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization
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Larsson, Erik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135763
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430. 
Cover image for Principles and Applications of NanoMEMS Physics
Principles and Applications of NanoMEMS Physics
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Santos, Héctor J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136228
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431. 
Cover image for Thin Films and Heterostructures for Oxide Electronics
Thin Films and Heterostructures for Oxide Electronics
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Ogale, Satischandra B. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136780
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432. 
Cover image for Transaction Level Modeling with SystemC TLM Concepts and Applications for Embedded Systems
Transaction Level Modeling with SystemC TLM Concepts and Applications for Embedded Systems
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Ghenassia, Frank. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137175
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