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433. 
Cover image for Semiconductor Physical Electronics
Semiconductor Physical Electronics
Author 
Li, Sheng S. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37766-2
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434. 
Cover image for Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisations
Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisations
Author 
Kasper, Erich. author. Paul, D.J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137494
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435. 
Cover image for Force Sensors for Microelectronic Packaging Applications
Force Sensors for Microelectronic Packaging Applications
Author 
Schwizer, Jürg. author. Mayer, Michael. author. Brand, Oliver. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138345
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436. 
Cover image for Gettering Defects in Semiconductors
Gettering Defects in Semiconductors
Author 
Perevoschikov, Victor A. author. Skoupov, Vladimir D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29499-6
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437. 
Cover image for Semiconductor Nanocrystals and Silicate Nanoparticles
Semiconductor Nanocrystals and Silicate Nanoparticles
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Peng, X. editor. Mingos, D. M. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b11020
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438. 
Cover image for Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Author 
Flandre, Denis. editor. Nazarov, Alexei N. editor. Hemment, Peter L.F. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3013-4
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439. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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440. 
Cover image for Materials Fundamentals of Gate Dielectrics
Materials Fundamentals of Gate Dielectrics
Author 
Demkov, Alexander A. editor. Navrotsky, Alexandra. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3078-9
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441. 
Cover image for Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003
Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003
Author 
Joyce, Bruce A. editor. Kelires, Pantelis C. editor. Naumovets, Anton G. editor. Vvedensky, Dimitri D. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3315-X
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442. 
Cover image for VLSI-Design of Non-Volatile Memories
VLSI-Design of Non-Volatile Memories
Author 
Campardo, Giovanni. author. Micheloni, Rino. author. Novosel, David. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137712
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443. 
Cover image for High Dielectric Constant Materials VLSI MOSFET Applications
High Dielectric Constant Materials VLSI MOSFET Applications
Author 
Huff, H.R. editor. Gilmer, D.C. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137574
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444. 
Cover image for Fundamentals of Semiconductors Physics and Materials Properties
Fundamentals of Semiconductors Physics and Materials Properties
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Yu, Peter Y. Cardona, Manuel. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137661
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