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1. 
Cover image for Phase estimation in optical interferometry
Phase estimation in optical interferometry
Author 
Rastogi, Pramod K., 1951- editor. Hack, Erwin, editor.
Preferred Shelf Number 
ONLINE(356750.1)
Electronic Access 
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2. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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3. 
Cover image for Optical shop testing
Optical shop testing
Author 
Malacara, Daniel, 1937- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470135976
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4. 
Cover image for Interferogram analysis for optical testing
Interferogram analysis for optical testing
Author 
Malacara, Daniel, 1937- Servn̕, Manuel. Malacara, Zacarias, 1948-
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ONLINE
Electronic Access 
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