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1. 
Cover image for Advanced Batteries Materials Science Aspects
Advanced Batteries Materials Science Aspects
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Huggins, Robert A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76424-5
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2. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8615-1
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3. 
Cover image for Electron Correlation in New Materials and Nanosystems
Electron Correlation in New Materials and Nanosystems
Author 
Scharnberg, Kurt. editor. Kruchinin, Sergei. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5659-8
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4. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73886-2
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5. 
Cover image for Materials for Information Technology Devices, Interconnects and Packaging
Materials for Information Technology Devices, Interconnects and Packaging
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Zschech, Ehrenfried. editor. Whelan, Caroline. editor. Mikolajick, Thomas. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-235-7
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6. 
Cover image for Spectroscopic Properties of Rare Earths in Optical Materials
Spectroscopic Properties of Rare Earths in Optical Materials
Author 
Hull, Robert. editor. Parisi, Jürgen. editor. Osgood, R. M. editor. Warlimont, Hans. editor. Liu, Guokui. editor.
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http://dx.doi.org/10.1007/3-540-28209-2
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7. 
Cover image for Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Author 
Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-32989-7
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8. 
Cover image for Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
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Lang, Sidney B. author. Chan, Helen L. W. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-38039-1
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9. 
Cover image for Fundamentals of Powder Diffraction and Structural Characterization of Materials
Fundamentals of Powder Diffraction and Structural Characterization of Materials
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Pecharsky, Vitalij K. author. Zavalij, Peter Y. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b106242
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10. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-31915-8
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11. 
Cover image for Oxide and Nitride Semiconductors Processing, Properties, and Applications
Oxide and Nitride Semiconductors Processing, Properties, and Applications
Author 
Yao, Takafumi. editor. Hong, Soon-Ku. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-88847-5
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12. 
Cover image for Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Author 
Seebauer, Edmund G. author. Kratzer, Meredith C. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84882-059-3
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