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28477. 
Cover image for Visual C# 2010 Recipes A Problem-Solution Approach
Visual C# 2010 Recipes A Problem-Solution Approach
Author 
Jones, Allen. author. Freeman, Adam. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4302-2526-3
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28478. 
Cover image for The Definitive Guide To Jython Python For The Java™ Platform
The Definitive Guide To Jython Python For The Java™ Platform
Author 
Juneau, Josh. author. Baker, Jim. author. Ng, Victor. author. Soto, Leo. author. Wierzbicki, Frank. author.
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http://dx.doi.org/10.1007/978-1-4302-2528-7
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28479. 
Cover image for Pro ASP.NET 4 in C# 2010
Pro ASP.NET 4 in C# 2010
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MacDonald, Matthew. author. Freeman, Adam. author. Szpuszta, Mario. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4302-2530-0
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28480. 
Cover image for Accelerated C# 2010
Accelerated C# 2010
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Nash, Trey. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4302-2538-6
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28481. 
Cover image for The Essential Guide to 3D in Flash
The Essential Guide to 3D in Flash
Author 
Bateman, Rob. author. Olsson, Richard. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4302-2542-3
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28482. 
Cover image for Technical Support Essentials Advice You Can Use to Succeed in Technical Support
Technical Support Essentials Advice You Can Use to Succeed in Technical Support
Author 
Sanchez, Andres R. author. Pepper, Jeffrey. editor. Andres, Clay. editor. Anglin, Steve. editor. Beckner, Mark. editor.
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http://dx.doi.org/10.1007/978-1-4302-2548-5
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28483. 
Cover image for Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring
Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring
Author 
Kuon, Ian. author. Rose, Jonathan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0739-4
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28484. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0928-2
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28485. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
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http://dx.doi.org/10.1007/978-1-4419-0938-1
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28486. 
Cover image for Designing Embedded Systems with the SIGNAL Programming Language Synchronous, Reactive Specification
Designing Embedded Systems with the SIGNAL Programming Language Synchronous, Reactive Specification
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Gamatie, Abdoulaye. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0941-1
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28487. 
Cover image for On and Off-Chip Crosstalk Avoidance in VLSI Design
On and Off-Chip Crosstalk Avoidance in VLSI Design
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Duan, Chunjie. author. LaMeres, Brock J. author. Khatri, Sunil P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0947-3
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28488. 
Cover image for Security in Embedded Devices
Security in Embedded Devices
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Gebotys, Catherine H. author. SpringerLink (Online service)
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