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2701. 
Cover image for Principles of biomechanics
Principles of biomechanics
Author 
Huston, Ronald L., 1937-
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2702. 
Cover image for Creep, shrinkage and durability mechanics of concrete and concrete structures proceedings of the Eighth International Conference on Creep, Shrinkage and Durability of Concrete and Concrete Structures, Ise-Shima, Japan, 30 September-2 October 2008
Creep, shrinkage and durability mechanics of concrete and concrete structures proceedings of the Eighth International Conference on Creep, Shrinkage and Durability of Concrete and Concrete Structures, Ise-Shima, Japan, 30 September-2 October 2008
Author 
International Conference on Creepage, Shrinkage and Durability of Concrete and Concrete structures (8th : 2008 : Ise-Shima, Japan) Tanabe, Tadaaki, 1940-
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2703. 
Cover image for Marine navigation and safety of sea transportation
Marine navigation and safety of sea transportation
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International Navigational Symposium on Marine Navigation and Safety of Sea Transportation (8th : 2009 : Gdynia, Poland) Weintrit, Adam.
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2704. 
Cover image for Advanced testing and characterization of bituminous materials
Advanced testing and characterization of bituminous materials
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International RILEM symposium (7th : 2009 : Rhodes, Greece) Loizos, Andreas.
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2705. 
Cover image for Creating games : mechanics, content, and technology
Creating games : mechanics, content, and technology
Author 
McGuire, Morgan, 1976- Jenkins, Odest Chadwicke.
Preferred Shelf Number 
QA76.76.C672 M388 2009
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2706. 
Cover image for Statistical models : theory and practice
Statistical models : theory and practice
Author 
Freedman, David, 1938-2008, author.
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QA279 .F74 2009
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https://doi.org/10.1017/CBO9780511815867
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2707. 
Cover image for Applied geostatistics with sgems : a user's guide
Applied geostatistics with sgems : a user's guide
Author 
Remy, Nicolas. Boucher, Alexandre. Wu, Jianbing.
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QE48.8 .R46 2009
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2708. 
Cover image for Smart materials
Smart materials
Author 
Schwartz, Mel M.
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2709. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.
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2710. 
Cover image for Topographic laser ranging and scanning principles and processing
Topographic laser ranging and scanning principles and processing
Author 
Shan, Jie. Toth, Charles K.
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2711. 
Cover image for Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Author 
Deleonibus, Simon.
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2712. 
Cover image for Nanomedicine a systems engineering approach
Nanomedicine a systems engineering approach
Author 
Zhang, Mingjun. Xi, Ning.
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