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37. 
Cover image for Fundamentals of semiconductor manufacturing and process control
Fundamentals of semiconductor manufacturing and process control
Author 
May, Gary S. Spanos, Costas J.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952
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38. 
Cover image for Instrument engineers' handbook. Vol. 2, Process control and optimization
Instrument engineers' handbook. Vol. 2, Process control and optimization
Author 
Liptak, Bela G.
Preferred Shelf Number 
TS156.8 .I57 2006
Electronic Access 
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39. 
Cover image for Practical process control for engineers and technicians
Practical process control for engineers and technicians
Author 
Altmann, Wolfgang. Macdonald, Dave, 1942-
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ScienceDirect http://www.sciencedirect.com/science/book/9780750664004
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40. 
Cover image for The integration of process design and control
The integration of process design and control
Author 
Seferlis, Panagiotis, 1967- Georgiadis, Michael C.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444515575
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41. 
Cover image for Process control systems : application, design and tuning
Process control systems : application, design and tuning
Author 
Shinskey, F. Greg.
Preferred Shelf Number 
TP 155.75 S5 1988
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42. 
Cover image for Automated process control systems : concepte and hardware
Automated process control systems : concepte and hardware
Author 
Hunter, Ronald P.
Preferred Shelf Number 
TS 156.8 H86 1987
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43. 
Cover image for Handbook of food process modeling and statistical quality control
Handbook of food process modeling and statistical quality control
Author 
Özilgen, Mustafa. Özilgen, Mustafa. Food process modeling and statistical quality control.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=361935
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44. 
Cover image for Handbook of food process modeling and statistical quality control : with extensive MATLAB applications
Handbook of food process modeling and statistical quality control : with extensive MATLAB applications
Author 
Ozilgen, Mustafa., author. Ozilgen, Mustafa. Food process modeling and statistical quality control.
Preferred Shelf Number 
TP372.7 .O95 2011
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45. 
Cover image for Yapay sinir ağları ve ASM2 kullanılarak aktif çamur prosesinin kontrolü ve modellenmesi = Control and modelling of activated sludge process by using artificial neural networks and ASM2
Yapay sinir ağları ve ASM2 kullanılarak aktif çamur prosesinin kontrolü ve modellenmesi = Control and modelling of activated sludge process by using artificial neural networks and ASM2
Author 
Öztürk, Cumhur
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TEZ/8313 .O988 2007
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46. 
Cover image for Coulson & Richardson's chemical engineering. Vol. 3, Chemical & biochemical reactors & process control
Coulson & Richardson's chemical engineering. Vol. 3, Chemical & biochemical reactors & process control
Author 
Richardson, J. F. (John Francis) Peacock, D. G. (Donald George), 1927- Coulson, J. M. (John Metcalfe). Chemical engineering.
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ScienceDirect http://www.sciencedirect.com/science/book/9780080571546
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47. 
Cover image for Characterization and control of odours and VOC in the process industries proceedings of the Second International Symposium on Characterization and Control of Odours and VOC in the Process Industries, Louvain-la-Neuve, Belgium, 3-5 November 1993
Characterization and control of odours and VOC in the process industries proceedings of the Second International Symposium on Characterization and Control of Odours and VOC in the Process Industries, Louvain-la-Neuve, Belgium, 3-5 November 1993
Author 
International Symposium on Characterization and Control of Odours and VOC in the Process Industries (2nd : 1993 : Louvain-la-Neuve, Belgium) Vigneron, S. Hermia, J. Chaouki, J. Société belge de filtration.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444817891
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48. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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